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Hierarchical Modelling For Very Large Scale Integration Circuit Testing

Bhattacharya , John P. Hayes, Debashis Bhattacharya and Hayes

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Hardback

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Hierarchical Modelling For Very Large Scale Integration Circuit Testing

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Product Details

ISBN:: 9780792390589
Category:: General
Format:: Hardback
Publication Date:: 1989-12-01
Series:: The Springer International Series in Engineering and Computer Science
Publisher:: KLUWER ACADEMIC PUBLISHERS
Illustrations:: black & white illustrations
Country of origin:: United States
Pages:: 176
Pagination:: 176 pages
Dimensions (mm):: 234x156x11mm
Weight:: 940g