Ionizing Radiation Effects in Metal-oxide Semiconductor Devices and Circuits 1

by T. P. Ma and Paul V. Dressendorfer

Hardback Publication Date: 07/06/1989

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The first comprehensive overview describing the effects of ionizing radiation on MOS devices, as well as how to design, fabricate, and test integrated circuits intended for use in a radiation environment. Also addresses process--induced radiation effects in the fabrication of high--density circuits. Reviews the history of radiation--hard technology, providing background information for those new to the field. Includes a comprehensive review of the literature and an annotated listing of research activities in radiation--hardness research.
ISBN:
9780471848936
Category:
Circuits & components
Format:
Hardback
Publication Date:
07-06-1989
Language:
English
Publisher:
John Wiley & Sons Inc
Country of origin:
United States
Pages:
608
Dimensions (mm):
244x168x37mm
Weight:
1.01kg
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