Ionizing Radiation Effects in Metal-oxide Semiconductor Devices and Circuits

Ionizing Radiation Effects in Metal-oxide Semiconductor Devices and Circuits

by T. P. Ma and Paul V. Dressendorfer

Publication Date: 07/06/1989

  $579.99
The first comprehensive overview describing the effects of ionizing radiation on MOS devices, as well as how to design, fabricate, and test integrated circuits intended for use in a radiation environment. Also addresses process--induced radiation effects in the fabrication of high--density circuits. Reviews the history of radiation--hard technology, providing background information for those new to the field. Includes a comprehensive review of the literature and an annotated listing of research activities in radiation--hardness research.
ISBN:
9780471848936
Category:
Circuits & components
Publication Date:
07-06-1989
Language:
English
Publisher:
John Wiley & Sons Inc
Country of origin:
United States
Pages:
608
Dimensions (mm):
244x168x37mm
Weight:
1.01kg
  • On order from our UK supplier to our Sydney distribution centre
  • Once received into our distribution centre, we will despatch and inform you via email.
  • Arrives in 2-4 days after despatch for most Australian capitals.

Customer Reviews

Be the first to review Ionizing Radiation Effects in Metal-oxide Semiconductor Devices and Circuits.