Each chapter in this book is written by a group of experts in one particular type of microprobe technique. They emphasize the ability of that technique to provide information about small structures (quantum dots, quantum lines), microscopic defects, strain, layer composition, and its usefulness as diagnostic techniques for device degradation. Different types of probes are considered (electrons, photon and tips) and different microscopies (optical, electron microscopy and tunnelling). It is a reference for post-graduate and experienced researchers, as well as for crystal growers and optoelectronic device makers.
- ISBN:
- 9781560329411
- 9781560329411
-
Category:
- Materials science
- Format:
- Hardback
- Publication Date:
-
15-11-2002
- Language:
- English
- Publisher:
- Taylor & Francis Inc
- Country of origin:
- United States
- Pages:
- 730
- Dimensions (mm):
- 229x152x45mm
- Weight:
- 1.07kg
This title is in stock with our overseas supplier and should be sent from our Sydney warehouse within 3 - 4 weeks of you placing an order.
Once received into our warehouse we will despatch it to you with a Shipping Notification which includes online tracking.
Please check the estimated delivery times below for your region, for after your order is despatched from our warehouse:
ACT Metro 2 working days
NSW Metro 2 working days
NSW Rural 2-3 working days
NSW Remote 2-5 working days
NT Metro 3-6 working days
NT Remote 4-10 working days
QLD Metro 2-4 working days
QLD Rural 2-5 working days
QLD Remote 2-7 working days
SA Metro 2-5 working days
SA Rural 3-6 working days
SA Remote 3-7 working days
TAS Metro 3-6 working days
TAS Rural 3-6 working days
VIC Metro 2-3 working days
VIC Rural 2-4 working days
VIC Remote 2-5 working days
WA Metro 3-6 working days
WA Rural 4-8 working days
WA Remote 4-12 working days
Share This Book: