Developed from notes for teaching the fundamentals of light-scatter measurement and analysis to optical engineers at various conferences over several years, and first published in 1992 partly to help engineers attain the fast quality control being demanded in such high-volume industries as paper, steel, aluminum, and ceramics. In addition to a general tidying throughout, including getting Figure 8.5 right side up, the chapter on roughness calculations has been considerably revised, and new sections have been added on rough surfaces and the inspection of silicon wafers and computer disks. Annotation c. by Book News, Inc., Portland, Or.