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Life-Cycle Assessment of Semiconductors

Life-Cycle Assessment of Semiconductors

by Sarah B. Boyd
Paperback
Publication Date: 17/09/2014
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Life-Cycle Assessment of Semiconductors presents the first and thus far only available transparent and complete life cycle assessment of semiconductor devices. A lack of reliable semiconductor LCA data has been a major challenge to evaluation of the potential environmental benefits of information technologies (IT). The analysis and results presented in this book will allow a higher degree of confidence and certainty in decisions concerning the use of IT in efforts to reduce climate change and other environmental effects. Coverage includes but is not limited to semiconductor manufacturing trends by product type and geography, unique coverage of life-cycle assessment, with a focus on uncertainty and sensitivity analysis of energy and global warming missions for CMOS logic devices, life cycle assessment of flash memory and life cycle assessment of DRAM. The information and conclusions discussed here will be highly relevant and useful to individuals and institutions.
ISBN:
9781489992239
9781489992239
Category:
Electronics engineering
Format:
Paperback
Publication Date:
17-09-2014
Publisher:
Springer-Verlag New York Inc.
Country of origin:
United States
Pages:
226
Dimensions (mm):
235x155x14mm
Weight:
0.4kg

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