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Nanometrology Using Transmission Electron Microscopy

Nanometrology Using Transmission Electron Microscopy

by Vlad Stolojan
Paperback
Publication Date: 30/09/2015
RRP  $72.60 $70.95
This item qualifies for FREE delivery
The Transmission Electron Microscope (TEM) is the ultimate tool to see and measure structures on the nanoscale and to probe their elemental composition and electronic structure with sub-nanometer spatial resolution. Recent technological breakthroughs have revolutionized our understanding of materials via use of the TEM, and it promises to become a significant tool in understanding biological and biomolecular systems such as viruses and DNA molecules. This book is a practical guide for scientists who need to use the TEM as a tool to answer questions about physical and chemical phenomena on the nanoscale.

It guides the reader by: helping to understand the type of information available and the requirements placed on the sample; advising on how to prepare the sample and the experiments that will generate the best-quality information and with what uncertainty. It covers the majority of practical aspects in acquiring and processing images and spectra (X-ray and energy loss).

Seeing on the nanoscale is a voyage of discovery, one that can start right here.
ISBN:
9781681740560
9781681740560
Category:
Engineering measurement & calibration
Format:
Paperback
Publication Date:
30-09-2015
Publisher:
Morgan & Claypool Publishers
Country of origin:
United States
Pages:
85
Dimensions (mm):
254x175x4mm
Weight:
0.14kg

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