6 1/2 X 9 7/16 in Foreword by Prof. Neil Alford, F R Eng. Imperial College London
Chapter 1. Introduction

Chapter 2. Mea surement of microwave dielectric properties and factors affecting them
2.1. Permittivity
2.2. Qualit y factor (Q)
2.3. Measurement of microwave dielectric prope rties
2.3.1. Hakki and Coleman (Courtney) method
2.3.1.1. Measurement of Permittivity
2.3.1.2. Meas urement of loss tangent
2.3.2. TE01 ) mode d ielectric resonator method
2.3.3. Measurement of quality f actor by stripline method
2.3.4. Whispering Gallery Mode r esonators
2.3.5. Split Post Dielectric Resonator (SPDR) me thod
2.3.6. Cavity Perturbation method
2.3. 7. TM010 mode and Re-entrant cavity method
2.3. 8. TE01n mode cavities
2.4. Estimation of diele ctric loss by spectroscopic methods
2.5. Factors affecting the dielectric loss
2.6. Correction for porosity