Hardback
Publication Date: 03/08/2004
This book provides a detailed treatment of radiation effects in electronic devices, including effects at the material, device, and circuit levels. The emphasis is on transient effects caused by single ionizing particles (single-event effects and soft errors) and effects produced by the cumulative energy deposited by the radiation (total ionizing dose effects). Bipolar (Si and SiGe), metal-oxide- semiconductor (MOS), and compound semiconductor technologies are discussed. In addition to considering the specific issues associated with high-performance devices and technologies, the book includes the background material necessary for understanding radiation effects at a more general level.
- ISBN:
- 9789812389404
- 9789812389404
- Category:
- Circuits & components
- Format:
- Hardback
- Publication Date:
- 03-08-2004
- Publisher:
- World Scientific Publishing Co Pte Ltd
- Country of origin:
- Singapore
- Pages:
- 348
- Dimensions (mm):
- 249x168x23mm
- Weight:
- 0.68kg
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