This monograph is concerned with the direct-scattering of electromagnetic waves by one- and two-dimensional objects, and the use of this technique in one-dimensional inverse profiling. It discusses results of research into the method of this technique and its application to specific problems.

Several techniques are presented for solving transient electromagnetic direct-scattering problems. These problems are solved indirectly, via a Fourier or Laplace transformation to the real- or complex-frequency domain, as well as directly in the time domain.

For the one-dimensional case it is described how the special features of the respective techniques are also exploited to tackle the inverse problem of determining obstacle properties from the scattered field excited by a known incident field. The problems of both identification and of inverse profiling are addressed.

For a range of specific problems representative numerical results are presented and discussed. Particular attention is devoted to the numerical implementation and to the physical interpretation of the theoretical numerical results obtained. With respect to inverse-scattering the emphasis is on the band-limiting effects that may arise due to approximation errors in the various inversion schemes employed.