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Electron Energy-Loss Spectroscopy in the Electron Microscope

Electron Energy-Loss Spectroscopy in the Electron Microscope

by R.F. Egerton
Paperback
Publication Date: 01/10/2014
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Within the last 30 years, electron energy-loss spectroscopy (EELS) has become a standard analytical technique used in the transmission electron microscope to extract chemical and structural information down to the atomic level. In two previous editions, Electron Energy-Loss Spectroscopy in the Electron Microscope has become the standard reference guide to the instrumentation, physics and procedures involved, and the kind of results obtainable. Within the last few years, the commercial availability of lens-aberration correctors and electron-beam monochromators has further increased the spatial and energy resolution of EELS. This thoroughly updated and revised Third Edition incorporates these new developments, as well as advances in electron-scattering theory, spectral and image processing, and recent applications in fields such as nanotechnology. The appendices now contain a listing of inelastic mean free paths and a description of more than 20 MATLAB programs for calculating EELS data.
ISBN:
9781489986498
9781489986498
Category:
Testing of materials
Format:
Paperback
Publication Date:
01-10-2014
Publisher:
Springer-Verlag New York Inc.
Country of origin:
United States
Edition:
3rd Edition
Pages:
491
Dimensions (mm):
235x155x26mm
Weight:
0.76kg

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