This is the first book on lock-in thermography, an analytical method applied to the diagnosis of microelectronic devices. This useful introduction and guide reviews various experimental approaches to lock-in thermography, with special emphasis on the lock-in IR thermography developed by the authors themselves.
- ISBN:
- 9783319998244
- 9783319998244
-
Category:
- Electronics engineering
- Format:
- Hardback
- Publication Date:
-
25-11-2018
- Publisher:
- Springer International Publishing AG
- Country of origin:
- Switzerland
- Edition:
- 3rd Edition
- Pages:
- 321
- Dimensions (mm):
- 235x155mm
- Weight:
- 0.68kg
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