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Machine Vision Inspection Systems, Machine Learning-Based Approaches

Machine Vision Inspection Systems, Machine Learning-Based Approaches

by Muthukumaran MalarvelSoumya Ranjan Nayak Prasant Kumar Pattnaik and others
Hardback
Publication Date: 26/01/2021

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Machine Vision Inspection Systems (MVIS) is a multidisciplinary research field that emphasizes image processing, machine vision and, pattern recognition for industrial applications. Inspection techniques are generally used in destructive and non-destructive evaluation industry. Now a day's the current research on machine inspection gained more popularity among various researchers, because the manual assessment of the inspection may fail and turn into false assessment due to a large number of examining while inspection process.

This volume 2 covers machine learning-based approaches in MVIS applications and it can be employed to a wide diversity of problems particularly in Non-Destructive testing (NDT), presence/absence detection, defect/fault detection (weld, textile, tiles, wood, etc.), automated vision test & measurement, pattern matching, optical character recognition & verification (OCR/OCV), natural language processing, medical diagnosis, etc. This edited book is designed to address various aspects of recent methodologies, concepts, and research plan out to the readers for giving more depth insights for perusing research on machine vision using machine learning-based approaches.

ISBN:
9781119786092
9781119786092
Category:
Electronics & communications engineering
Format:
Hardback
Publication Date:
26-01-2021
Language:
English
Publisher:
John\Wiley#& Sons, Incorporated
Country of origin:
United States
Dimensions (mm):
238x166x23.49mm
Weight:
0.6kg

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