Free shipping on orders over $99
Pattern Recognition

Pattern Recognition

7th Mexican Conference, MCPR 2015, Mexico City, Mexico, June 24-27, 2015, Proceedings

by Fazel FamiliJose Arturo Olvera Lopez Juan Humberto Sossa-Azuela and others
Paperback
Publication Date: 01/06/2015

Share This Book:

  $84.99
or 4 easy payments of $21.25 with
afterpay
This book constitutes the refereed proceedings of the 7th Mexican Conference on Pattern Recognition, MCPR 2015, held in Mexico City Mexico, in June 2015.

The 30 revised full papers presented were carefully reviewed and selected from 63 submissions. The papers are organized in topical sections on pattern recognition and artificial intelligence; image processing and analysis; robotics and computer vision; natural language processing and recognition; and applications of pattern recognition.
ISBN:
9783319192635
9783319192635
Category:
Pattern recognition
Format:
Paperback
Publication Date:
01-06-2015
Publisher:
Springer International Publishing AG
Country of origin:
Switzerland
Pages:
314
Dimensions (mm):
235x155x18mm
Weight:
4.98kg

This title is in stock with our Australian supplier and should arrive at our Sydney warehouse within 2 - 3 weeks of you placing an order.

Once received into our warehouse we will despatch it to you with a Shipping Notification which includes online tracking.

Please check the estimated delivery times below for your region, for after your order is despatched from our warehouse:

ACT Metro: 2 working days
NSW Metro: 2 working days
NSW Rural: 2-3 working days
NSW Remote: 2-5 working days
NT Metro: 3-6 working days
NT Remote: 4-10 working days
QLD Metro: 2-4 working days
QLD Rural: 2-5 working days
QLD Remote: 2-7 working days
SA Metro: 2-5 working days
SA Rural: 3-6 working days
SA Remote: 3-7 working days
TAS Metro: 3-6 working days
TAS Rural: 3-6 working days
VIC Metro: 2-3 working days
VIC Rural: 2-4 working days
VIC Remote: 2-5 working days
WA Metro: 3-6 working days
WA Rural: 4-8 working days
WA Remote: 4-12 working days

Reviews

Be the first to review Pattern Recognition.