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Random Testing of Digital Circuits

Random Testing of Digital Circuits

Theory and Applications

by Rene David
Hardback
Publication Date: 08/04/1998

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Introduces a theory of random testing in digital circuits for the first time and offers practical guidance for the implementation of random pattern generators, signature analyzers design for random testability, and testing results. Contains several new and unpublished results.
ISBN:
9780824701826
9780824701826
Category:
Circuits & components
Format:
Hardback
Publication Date:
08-04-1998
Language:
English
Publisher:
Taylor & Francis Inc
Country of origin:
United States
Pages:
500
Dimensions (mm):
229x152x29mm
Weight:
0.86kg

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