This text provides students as well as practitioners with a comprehensive introduction to the field of scanning electron microscopy (SEM) and X-ray microanalysis. The authors emphasize the practical aspects of the techniques described. Topics discussed include user-controlled functions of scanning electron microscopes and x-ray spectrometers and the use of x-rays for qualitative and quantitative analysis. Separate chapters cover SEM sample preparation methods for hard materials, polymers, and biological specimens. In addition techniques for the elimination of charging in non-conducting specimens are detailed.
- ISBN:
- 9781461349693
- 9781461349693
-
Category:
- Testing of materials
- Format:
- Paperback
- Publication Date:
-
31-05-2013
- Language:
- English
- Publisher:
- Springer-Verlag New York Inc.
- Country of origin:
- United States
- Edition:
- 3rd Edition
- Pages:
- 689
- Dimensions (mm):
- 254x178x37mm
- Weight:
- 1.35kg
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