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Scanning Transmission Electron Microscopy Of Nanomaterials: Basics Of Imaging And Analysis

Scanning Transmission Electron Microscopy Of Nanomaterials: Basics Of Imaging And Analysis

Basics, Present Status and Future Prospects

by Nobuo Tanaka
Hardback
Publication Date: 13/10/2014

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$237.00
The basics, present status and future prospects of high-resolution scanning transmission electron microscopy (STEM) are described in the form of a textbook for advanced undergraduates and graduate students. This volume covers recent achievements in the field of STEM obtained with advanced technologies such as spherical aberration correction, monochromator, high-sensitivity electron energy loss spectroscopy and the software of image mapping. The future prospects chapter also deals with z-slice imaging and confocal STEM for 3D analysis of nanostructured materials.
ISBN:
9781848167896
9781848167896
Category:
Optical physics
Format:
Hardback
Publication Date:
13-10-2014
Publisher:
Imperial College Press
Country of origin:
United Kingdom
Pages:
616
Dimensions (mm):
229x155x33mm
Weight:
1.04kg

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