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Spectroscopy of Complex Oxide Interfaces

Spectroscopy of Complex Oxide Interfaces

Photoemission and Related Spectroscopies

by Claudia Cancellieri and Vladimir N. Strocov
Paperback
Publication Date: 04/05/2019

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This book summarizes the most recent and compelling experimental results for complex oxide interfaces. The results of this book were obtained with the cutting-edge photoemission technique at highest energy resolution. Due to their fascinating properties for new-generation electronic devices and the challenge of investigating buried regions, the book chiefly focuses on complex oxide interfaces.
The crucial feature of exploring buried interfaces is the use of soft X-ray angle-resolved photoemission spectroscopy (ARPES) operating on the energy range of a few hundred eV to increase the photoelectron mean free path, enabling the photons to penetrate through the top layers - in contrast to conventional ultraviolet (UV)-ARPES techniques. The results presented here, achieved by different research groups around the world, are summarized in a clearly structured way and discussed in comparison with other photoemission spectroscopy techniques and other oxide materials. They are complemented and supported by the most recent theoretical calculations as well as results of complementary experimental techniques including electron transport and inelastic resonant X-ray scattering.
ISBN:
9783030091217
9783030091217
Category:
Testing of materials
Format:
Paperback
Publication Date:
04-05-2019
Publisher:
Springer Nature Switzerland AG
Country of origin:
Switzerland
Pages:
320
Dimensions (mm):
235x155x18mm
Weight:
0.52kg

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