Part I. Statistical Process Control.- Chapter 1. Some Recent Studies in Statistical Process Control.- Chapter 2. Statistical Quality Control And Reliability Analysis Using the Birnbaum-Saunders Distribution with Industrial Applications.- Chapter 3. Statistical System Monitoring (SSM) for Enterprise-Level Quality Control.- Chapter 4. Enhanced Cumulative Sum Charts based on Ranked Set Sampling.- Chapter 5. A Survey of Control Charts for Simple Linear Profile Processes with Authcorrelation.- Chapter 6. Sequential Monitoring of Circular processes related to the von Mises Distribution.- Part II. Acceptance Sampling Plans.- Chapter 7. Time Truncated Life Test Using the Generalized Multiple Dependent State Sampling plans for Various Life Distributions.- Chapter 8. Decision Theoretic Sampling Plan for One-parameter Exponential Distribution under Type-I and Type-I Hybrid Censoring Schemes.- Chapter 9. Economical Sampling Plans with Warranty.- Chapter 10. Design of Reliability Acceptance Sampling Plans under Partially Accelerated Life Test.- Part III. Reliability Testing and Designs. Chapter 11. Bayesian Sequential Design Based on Dual Objectives for Accelerated Life Tests.- Chapter 12. The Stress-strength Models for the Proportional Hazards Family and Proportional Reverse Hazards Family.- Chapter 13. A Degradation Based on the Wiener Process Assuming non-normal Distributed Measurement Errors.- Chapter 14. An Introduction of Generalized Linear Model Approach to Accelerated Life Test Planning with Type-I Censoring.- Chapter 15. Robust Design in the Case of Data Contamination and Model Departure.- Chapter 16. Defects Driven Yield and Reliability Modeling for Semiconductor Manufacturing