CMOS Plasma and Process Damage

CMOS Plasma and Process Damage

by Kirk Prall
Epub (Kobo), Epub (Adobe)
Publication Date: 16/05/2025

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This book discusses the complex technology of building CMOS computer chips and covers some of the unusual problems that can occur during chip manufacturing. Readers will learn how plasma and process damage results from the high-energy processes that are used in chip manufacturing, causing harm to the chips, functional failure and reliability problems.

ISBN:
9783031890291
9783031890291
Category:
Circuits & components
Format:
Epub (Kobo), Epub (Adobe)
Publication Date:
16-05-2025
Language:
English
Publisher:
Springer Nature Switzerland

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