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Atomic Force Microscopy in Process Engineering

Atomic Force Microscopy in Process Engineering

An Introduction to AFM for Improved Processes and Products

by Nidal Hilal and W. Richard Bowen
Hardback
Publication Date: 03/07/2009

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1. Basic Principles of Atomic Force Microscopy
Daniel Johnson, Nid al Hilal, W. Richard Bowen

2. Measurement of Particle and Surface Interactions Using Force Microscopy
Nidal Hilal, Daniel Johnson, W. Richard Bowen, Paul M. Williams

3. Quantification of Particle-Bub ble Interactions Using Atomic Force Microscopy
Nidal Hilal, Daniel Jo hnson


4. Investigating Membranes and Membrane Processes with A tomic Force Microscopy
W. Richard Bowen, Nidal Hilal

5. AFM an d Development of (Bio)Fouling Resistant Membranes
Nidal Hilal, W. Ric hard Bowen, Daniel Johnson, Huabing Yin

6. Nanoscale Analysis of Pharmaceuticals by Scanning Probe Microscopy
Clive J. Roberts

7. Micro/Nanoengineering and AFM for Cellular Sensing
Huabing Yin, Go rdon McPhee, Phil Dobson

8. Atomic Force Microscopy and Polymers on Surfaces
Vasileios Koutsos

9. Application of AFM for the St udy of Tensile and Microrheological Properties of Fluids
Matthew S. B arrow, P. Rhodri Williams

10. Future Prospects
W. Richard Bowe n and Nidal Hilal
ISBN:
9781856175173
9781856175173
Category:
Chemical engineering
Format:
Hardback
Publication Date:
03-07-2009
Language:
English
Publisher:
Elsevier Science & Technology
Country of origin:
United Kingdom
Pages:
304
Dimensions (mm):
229x152x18mm
Weight:
0.6kg

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