"Updates fundamentals and applications of all modes of x-ray spectrometry, including total reflection and polarized beam x-ray fluorescence analysis, and synchrotron radiation induced x-ray emission. Promotes the accurate measurement of samples while reducing the scattered background in the x-ray spectrum."
- ISBN:
- 9780824706005
- 9780824706005
-
Category:
- Spectrum analysis
- Format:
- Hardback
- Publication Date:
-
27-11-2001
- Language:
- English
- Publisher:
- Taylor & Francis Inc
- Country of origin:
- United States
- Edition:
- 2nd Edition
- Pages:
- 1004
- Dimensions (mm):
- 280x210x49mm
- Weight:
- 1.81kg
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